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Revolutionary hardware platform cuts weeks from DFT validation and debug.
The Teseda V520 is the first engineering test platform optimized specifically for benchtop design validation, silicon debug and failure analysis. The V520 works with Teseda’s comprehensive suite of powerful, interactive software tools to enable fast and accurate failure analysis in your lab or desktop environment.
The V520 effortlessly integrates into your design and FA environment regardless of what EDA design tools were used. Driven by our award-winning Teseda Workbench™ (TWB) debug environment, the V520 allows you to work in the familiar design context, rather than debugging in a sea of 1’s and 0’s. You quickly isolate device problems, localize faults to specific design instances and capture detailed failure logs for further gate-level physical diagnosis, either using Teseda’s Diagnostic Manager NetXY™, or other EDA-based diagnosis tools.
Teseda’s V520 Silicon Debug and Failure Analysis Test System
- 32Mb per pin pattern depth with up to 20Mb of acquire memory
- Flexible, per-pin timing capabilities for complex testing needs
- Use it for functional and scan-based testing, BIST and IDDq measurements
- DC parametric and Curve Tracing option
- Test when and where you need it - portable, lightweight and weighs just 13.5 lbs
The Teseda V520 is powerful enough to support both functional and DFT-based testing (Stuck-at, transition fault, BIST and IDDQ), yet is small, quiet and sits on your lab bench or in your office.
V520 Features and Benefits
| Small | Easily fits in your Engineering or FA lab |
|---|---|
| Portable | Testing where you need it, links easily to common FA lab equipment like emission microscopes, time resolved emissions (TRE) tools |
| 50Mhz Performance | Duplicate complex device timing requirements |
| Memory Depth | 20Mb capture memory allows you to fully diagnose device failures |
| Network Accessible | Share and access the tester remotely across multiple sites |
| Powerful Debug Software Tools | Compatible with a comprehensive suite of engineering debug and FA diagnosis software tools |
V520 Applications
Desktop Silicon Debug and Failure Analysis
Perform functional, stuck-at and transition fault testing at your bench. Using the Teseda Workbench interactive software tools, identify and diagnose failures quickly to their logical location. Cut time to root-cause failure analysis by up to 80%.
Curve Tracing and DC Device Characterization
With the V520’s optional DC Test Module (DCTM), characterize the DC performance of your device. Using the Teseda Workbench’s built-in interactive DC templates you can validate your device meets common DC specifications such as IiL, IiH, VoL and VoH.
With the additional DC Field Triage Package software option, add fully automated curve tracing capabilities as well as DC continuity and input leakage testing. Rapidly find common package faults such as broken or shorted bonding wires. Compare results against “golden” device data.
Emission Microscopy
The V520’s small size and low vibration make it a perfect fit for advanced dynamic failure analysis applications such as OBIRCH, LADA or time resolved emissions (TRE) testing. The system is purpose-designed to fit inside of any emission microscope or overhead dock to common dynamic circuit analysis tools like the EmmiScope-III™. Loop around any set of vectors. Generate triggers at specific fail locations.
The Teseda Workbench (TWB) software is easy to learn and makes dynamic testing-based device diagnosis efficient and productive.
Bringing Debug and FA to Your Desktop
Stop waiting for results back from ATE - with the Teseda V520, you have your own tool for benchtop silicon debug and failure analysis. Cut your silicon debug and FA turnaround time by as much as 80%. No more waiting for time on shared or rented ATE. No more travelling between buildings or sites. Own an easy-to-use, dedicated lab diagnostic resource that you control. The Teseda V520 is readily available whenever and wherever you need it.