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| Teseda and Mentor Graphics Partner to Speed Defect
Diagnosis |
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| YieldAssist and Teseda platform linked to provide iterative
diagnosis environment. |
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Ramp Yield quickly with Teseda’s
Diagnostic Manager Suite
In order to first ramp, then ensure stable production and high yield of today’s
semiconductor technology, it is necessary to thoroughly analyze potential
factors that may lower product yield and quality. Teseda’s Diagnostic
Manager suite of tools provides important information and links to the
wafer production and test process:
- Identify the physical location of an
electrical test failure
- Provide the logical information for a suspect Inspection defect
- Rapidly determine systemic defects from random defects
- Analyze which defects have the largest impact on yield
Whether you collect the data from Teseda’s V5xx series of Validation
and Failure Analysis
platforms, your own ATE, or various inspection equipment, the DM Suite
can be adapted
to work with your data and integrate into your environment.
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