We'll be attending the following events in 2008.
Check back often for updated
listings.
International Test Conference 2008
Booth Number: 109
Santa Clara Convention Center, Santa Clara, CA
October 28-30
INTERNATIONAL
TEST CONFERENCE 2008 – ITC is the world’s premier conference dedicated
to the electronic test of devices, boards and systems-covering the
complete cycle from design verification, test, diagnosis, failure analysis
and design improvement.
34th International Symposium for Testing and Failure Analysis
(ISTFA)
Booth Number: 306
Oregon Convention Center, Portland, Oregon
Conference: November 2-6
Exposition: November 4-5
34th International
Symposium for Testing and Failure Analysis – ISTFA - the industry’s
premier event for failure analysis professionals. ISTFA will present
original, unpublished work on FA topics of practical value presented
by professionals from around the globe. ISTFA is North America’s largest
FA-related trade show.
Teseda and Mentor Graphics Partner to Speed Defect
Diagnosis
YieldAssist and Teseda platform linked to provide iterative
diagnosis environment.
Teseda WorkBench™ DFT Intelligent™ Software — The
Teseda WorkBench™ software is designed specifically for real-time DFT debug
and validation to help you realize the full potential of the DFT that you
already use in your devices. Powerful, graphic-oriented diagnostic tools
process actual device test results, design hierarchy and scan-chain structures
from Automatic Test Program Generation-based STIL files. The net result is
DFT validation, silicon debug and failure analysis in days, not weeks.
Teseda V520™ DFT-Optimized™
Engineering Test Platform — The Teseda V520™ is the first engineering
test platform designed specifically for DFT validation and debug, not just
as a general- purpose tester adapted for DFT test. The hardware is powerful
enough for advanced DFT techniques yet so small and quiet it sits in your
lab bench top, or on your office desktop.
