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Teseda Corporation Scan-Based Silicon Validation & Failure Analysis Tools
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Need help to improve yield?

Have a sneak preview of NetXY™:

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Teseda’s Diagnostic Manager tools mine defect data to detect yield issues faster, and Teseda continues to work with the leading semiconductor companies and equipment vendors to improve the automation and effectiveness of data mining for yield analysis and improvement.

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Software Solutions
Teseda WorkBench
Scan XY
SecureXY
CellXY
NetXY
Hardware Solutions
V550
V520
Events Spotlight
Teseda Trade Show Schedule

Follow the link below for information on upcoming events where you can see Teseda products in action.
Teseda and Mentor Graphics Partner to Speed Defect Diagnosis

YieldAssist and Teseda platform linked to provide iterative diagnosis environment. 
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