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Rapidly Map Scan Failures to Physical Net Location
Teseda’s Diagnostic Manager NetXY enables failure analysis engineers to leverage the DFT features in your design to analyze captured tester fails and rapidly pinpoint the physical location of failures in silicon without requiring time-consuming device probing - reducing the time to localize faults by as much as 90%.
Diagnostic Manager NetXY interprets physical design information files, diagnostic fault candidate reports and tester-captured scan failure files to highlight reported mismatches of failed test results of the capturing scan cell into a physical XY location on the die.
Diagnostic Manager NetXY
Benefits of NetXY:
- Interprets EDA design files, scan-based test information, tester fail logs and diagnostic defect candidate reports to rapidly identify physical location of defects
- Works directly with V550 or V520 captured scan fail logs as well as production ATE
- Displays scan chains, nets and subnets with user-selectable detail and granularity
- Compatible fault candidate reports from EDA-based DFT tools like Mentor Graphics’ Tessent Diagnosis™ and Synopsys TetraMAX Diagnosis™
- Identify potential emission sites for each defect suspect quickly
To speed failing net determination, Diagnostic Manager NetXY can read in defect candidate reports from tools such as Mentor Graphics’ Tessent™ Diagnosis or Synopsys TetraMAX™ Diagnosis tools and overlay predicted fault locations onto the physical design view.
Diagnostic Manager NetXY has a built-in array of diagnosis features to quicken your fault to root-cause determination – failure bookmarking and automated logic cone tracing isolates common net intersections of failing logic cones. Easily identify driving nets vs. receiving nets. NetXY’s Pathfinder feature provides full net tracing of the all nets connected to the failing scan cell.
Use NetXY To Identify Overlapping Failing Logic Cones
Diagnostic Manager NetXY Features and Benefits
| Leverages DFT to localize X/Y locations of scan-detected defects | Leverages the DFT structures invested in the design to minimize debug cycle time. Locates XY fault locations faster, with higher precision. |
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| Works with all EDA-generated files and scan fail logs | Truly portable. Works with all EDA tools and tester types, regardless of vendor. |
| Provides a Common Design-based Communication Language | Design and FA communicate failures using design hierarchy, instance names, nets and physical XY locations, not vectors and failing bits |
| Identify likely causes of broken scan chains | Works with Teseda’s Broken Chain Analyzer to quickly resolve chain failures |
| Compatible with V550 and V520 fail logs as well as ATE | Offline, tester-independent diagnosis |
| Imports EDA fault diagnosis candidate reports | Works with your existing EDA infrastructure |
NetXY’s Pathfinder Feature Simplifies Failure Isolation
Cut Fault Localization Time by Up to 90%
Diagnostic Manager NetXY dramatically reduces the time it takes for you to identify the physical cause of failures by leveraging DFT and reducing the reliance on time-consuming probing and imaging methods. With Diagnostic Manager NetXY, you can quickly identify likely causes of logic failures and get to root cause faster and with more precision.