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NetXY™ is the newest
product in Teseda’s Diagnostic Manager™ series. In addition
to all of the ScanXY™ features
it includes the following:
- Net and subnet viewing capability
- Gate delay paths between scan cells
- Scan cell stitching highlighted by subnet
- Defect candidate subnet (where feasible)
- Metal layers
- Diagnose net trends based on scan and
defect gate candidates
Please call Teseda
for pricing and availability.
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| Teseda and Mentor Graphics Partner to Speed Defect
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| YieldAssist and Teseda platform linked to provide iterative
diagnosis environment. |
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