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Overview
Software
Teseda WorkBench™
ScanXY™
SecureXY™
CellXY™
NetXY™
Hardware
V550™
V520™
DataSheets
About Teseda - Overview

SecureXY™ was developed as an extension to the Diagnostic Manager Tool Suite™ to allow semiconductor companies to provide key failure analysis information to their device manufacturers without compromising the integrity of the IP in the design.



Physical View in ScanXY™

SecureXY™ works today in conjunction with ScanXY™, the first tool in the Diagnostic Manager Suite™. It will also support the upcoming Diagnostic Manager tools CellXY™, and NetXY™.



Physical view with IP protection
in SecureXY™

ScanXY™ is able to present failure data in a physical die view showing failing scan cells, failing scan chains and XY location data. SecureXY™ is able to take the same ScanXY™ data through the SecureLink option and present it as an XY view while protecting sensitive design IP information. Using the Secure Link option in ScanXY™, the design IP is protected at varying levels that can be preselected by the design creators. The design creators can select from a configuration menu varying levels of design information that will be included for viewing by the device manufacturer. In addition, the ScanXY™ user is able to select which test data is delivered to SecureXY™ and included in the view. The easy to use graphical Interface makes the tool easy to use and enables rapid communication with the manufacturer.

Click here to request a printed SecureXY™ Datasheet.

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SecureXY™ KEY BENEFITS:

• Allows Design and FA to communicate failing data in both structural language and XY location without compromising IP

• Speeds analysis of failing devices – hours instead of days

• Allows identification of Failure Trends based on analysis of multiple tests

• Works with any EDA DFT diagnostic flows and supports all EDA failure file formats

• Directly links to ScanXY and the Teseda WorkBench

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