SecureXY™ was developed as an extension to the Diagnostic
Manager Tool Suite™ to allow semiconductor companies to provide
key failure analysis information to their device manufacturers
without compromising the integrity of the IP in the design.

Physical View in ScanXY™
SecureXY™ works today in conjunction with ScanXY™,
the first tool in the Diagnostic Manager Suite™. It will also
support the upcoming Diagnostic Manager tools CellXY™,
and NetXY™.

Physical view with IP protection
in SecureXY™
ScanXY™ is able to present
failure data in a physical die view showing failing scan
cells, failing scan chains and XY location data. SecureXY™ is
able to take the same ScanXY™ data
through the SecureLink option and present it as an XY view
while protecting sensitive design IP information. Using the
Secure Link option in ScanXY™, the design IP is protected at varying
levels that can be preselected by the design creators. The
design creators can select from a configuration menu varying levels
of design information that will be included for viewing by
the device manufacturer. In addition, the ScanXY™ user is able
to select which test data is delivered to SecureXY™ and
included in the view. The easy to use graphical Interface
makes the tool easy to use and enables rapid communication
with the manufacturer.
Click here to request a printed SecureXY™ Datasheet.
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